In today’s modern era, Buyers and Procurement agents of semiconductor devices must address several major technical and business issues when it comes to the electrical/parametric testing of electronic components. Semiconductor device testing is a process that is as old as semiconductor devices themselves but is rarely understood by those who are not experienced engineers.
The solution to this problem is to have these testing decisions made by qualified and experienced people. This is the philosophy behind Rochester’s Engineering driven test approach. The clearest advantage to this approach is that the test engineer is precisely familiar with tester resources, possesses a complete understanding of the functionality and operation of the components to be tested, the fabrication.
The purpose of this paper is to provide a basic understanding of the fundamental elements of semiconductor IC testing with an overall focus on the quality of the test. This quality of the test is central to the effectiveness of the test process, and not all test is the same.