HomeTech ZoneTesting TimesCATR Anechoic Chamber For 5G mmWave Temperature Test

CATR Anechoic Chamber For 5G mmWave Temperature Test

It uses 3GPP Compact Antenna Test Range (CATR) for better test efficiency and improving 5G mmWave cell-phone RF characteristics

A new solution launched by Anritsu Corporation, the MA8172A-010 facilitates difficult temperature tests for 5G mmWave cell phones in Anritsu’s CATR Anechoic Chamber. The Temperature Testing Option can be either fitted at new MA8172A purchase or can be retrofitted as an upgrade to customers’ previously purchased units.

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Combined use with the Radio Communication Test Station MT8000A for 5G R&D applications and the New Radio RF Conformance Test System ME7873NR for 5G conformance tests facilitates confirmation of 5G mmWave cell-phone RF characteristics in a controlled temperature environment to help assure and improve cell-phone quality.

The small-footprint, CATR Anechoic Chamber MA8172A uses the 3GPP Compact Antenna Test Range (CATR) method to perform 5G mmWave tests. Supplying cool air from an air conditioner, etc., to the CATR Anechoic Chamber MA8172A is installed with Temperature Testing Option for configuration of the 3GPP Extreme Temperature Condition test environment covering –10°C to +55°C.

Additionally, continuous testing at low, normal and high temperatures is not only linked with improved test efficiency but also plays a key role in the growing mmWave market.
Anritsu Corporation launched sales from February 1 of its Temperature Testing Option MA8172A-010 upgrade for the CATR Anechoic Chamber MA8172A.


Vinay Prabhakar Minj
Vinay Prabhakar Minj
Vinay Prabhakar Minj is a technology writer and science communication specialist with a Master’s degree in Communication of Science and Innovation (Science Communication). He is a prolific contributor to Electronics For You, where he has authored over 1,000 articles covering electronics, semiconductors, embedded systems, IoT, and emerging technologies. With a strong foundation in science communication, Vinay focuses on translating complex engineering concepts into clear, accessible, and application-oriented content. His work spans topics such as sensor technologies, chip design, wireless systems, and next-generation electronics, making advanced innovations easier to understand for engineers, students, and industry professionals. Through his extensive contributions, he has built a reputation for delivering reliable, well-researched, and practical insights that help readers stay updated with the rapidly evolving electronics ecosystem. His writing bridges the gap between technical depth and real-world usability, supporting both learning and decision-making in the field.

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