Saturday, June 15, 2024

Broadband VNA System With Single-Sweep Coverage Up To 125 GHz

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VectorStar ME7838AX/EX has best-in-class performance over a wide frequency sweep that gives engineers greater confidence in mmWave designs

Offering sweep data coverage of up to 125 GHz/110 GHz which enable design engineers to improve their device model yields and performance is the VectorStar ME7838AX/EX series, a vector network analyser (VNA) with broadband systems by Anritsu Corporation. 

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As of now four broadband VectorStar-based VNA models from 10 MHz (optional 70 kHz) to 125 GHz are available. The addition of 5 GHz frequency sweep (compared to previous VectorStar systems), allows the ME7838AX, ME7838A4X, ME7838EX and ME7838E4X to meet the requirements of accurate component verification and broadband applications operating at 122 GHz.

The 3656C Series calibration and verification kits are characterised to 125 GHz, thus supporting measurements up to 125 GHz.

Best-in-class Performance

The VectorStar ME7838AX/EX provides best-in-class performance, similar to the existing VectorStar ME7838 series broadband systems, including superior time-domain analysis by utilising the most points available in a single channel with the widest broadband frequency and best resolution. Other performance benefits include:

  • industry-best millimetre wave (mmWave) noise floor and dynamic range at 120/125 GHz
  • calibration and measurement stability of 0.05° over 24 hours
  • broadband measurement speed of 1 second at 1601 points, 10 kHz IFBW

Being compact and lightweight mmWave modules for easy, precise and economical positioning on the wafer probe station, the ME7838AX/EX ME7838AX/EX provide a direct connection to on-wafer probes for maximum dynamic range and measurement stability. Included in the series is the first mmWave module with electronic power levelling for wide power level control of up to 50 dB.

Variety of Applications

The ME7838AX/EX is suitable for communication design engineers involved in designing systems for on-wafer applications, as well as on-wafer production facilities where a combination of RF, microwave and mmWave devices, components and subsystems need to be measured on the same wafer. 

The device is also optimal for institutes exploring new communication system technologies and involved in the development of silicon photonics solutions along with manufacturers.

Calibration kits are available with cal. coefficients (.ccf) only and with or without a verification kit. Anritsu also offers .s1p database definitions (and .ccf) calibration kits with or without verification kits. The ME7838AX/EX systems are available in 2- and 4-port configurations. Upgradation from the previous VectorStar ME7838 broadband system to the new system is possible. 


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