Wednesday, February 28, 2024

Photorelay For Improved Semiconductor Testing

By Nidhi Agarwal

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The photorelay improves semiconductor testing with performance, design, and versatility in high-speed applications.


Toshiba Electronics Europe GmbH has introduced a new photorelay, the TLP3475W, designed to enhance the performance of high-frequency signal applications. This device is mainly aimed at semiconductor testing, including high-speed memory, logic testers, and probe cards.

The applications of this technology are diverse and include measuring instruments, high-speed memory testers, and high-speed logic IC testers. It is also extensively used in Automatic Test Equipment (ATE) and probe cards. These varied applications showcase its versatility in different testing and measurement scenarios.

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The TLP3475W has a design that minimizes parasitic capacitance and inductance, reducing signal insertion loss at frequencies around 20GHz. This marks an enhancement over the previous model, TLP3475S. Features of the TLP3475W include a current requirement of less than 3.0mA to drive the LED, an on-state resistance of 1.1Ω, and an isolation voltage exceeding 300Vrms. Its output capacitance is under 20pF, contributing to switching times of approximately 2ms. The photorelay offers a normally open (NO) function, or 1-Form-A.

The product includes features such as a WSON4 package with dimensions of 1.45 mm × 2.0 mm and a height of 0.8 mm. It operates with a normally open (1-Form-A) configuration and an OFF-state output terminal voltage of at least 60 V. The LED trigger current is 3 mA, while the ON-state current can be up to 0.4 A. Its ON-state resistance is a maximum of 1.5 Ω. The output capacitance is 12 pF, going up to 20 pF. An aspect is its isolation voltage, which is a minimum of 300 Vrms. The product is halogen-free, as detailed in the “Devices in Halogen-Free Resin Packages” section of the datasheet. It features an insertion loss of 3 dB at a frequency of 20 GHz.

The TLP3475W is smaller than the S-VSON4T package from Toshiba, which is beneficial in multi-channel designs where space is limited. Its operating temperature range of -40ºC to +110ºC makes it suitable for industrial applications, including high-speed semiconductor testing.

For more information, click here.


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