HomeTech ZoneTesting TimesSignal Quality Analyser With FEC Analysis Function

Signal Quality Analyser With FEC Analysis Function

Suitable for real-time monitoring of 400GbE/800GbE communications equipment and device bit error rate evaluation

The PAM4 transmission method used by 400GbE facilitates fast digital data display using four voltage levels per unit time to transmit 2x data compared to conventional NRZ method. However, due to the narrower differences between the four voltage levels, there is greater susceptibility to noise and transmission path losses, making error-free transmission more difficult. As a result, error correction using FEC is applied to assure transmission quality.

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Consequently, evaluation of devices and transceivers supporting PAM4 requires jitter tolerance and sensitivity evaluations based on conventional bit error and error-free measurements along with measurement of error correction capability using FEC.

To meet the above-mentioned needs, the MP1900A series of high-quality bit error rate tester (BERT) for evaluating next-generation 400 and 800GbE high-speed devices and transceivers now comes with a new FEC Analysis function that detects FEC Symbol Errors based on the 400GbE FEC standard. Using this new function, changes in bit errors and FEC Symbol Errors having changes in input amplitude and jitter conditions can be monitored in real-time to quickly and reproducibly evaluate when Symbol Error counts exceed the correction ability of FEC.

Moreover, the new FEC Analysis function is compatible with conventional jitter tolerance automatic measurement software; one-button jitter tolerance measurement is supported based on whether or not error correction using FEC is possible.

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Applications include 400GbE/800GbE communications equipment and device bit error rate evaluation.

The new FEC Analysis function of the 116-Gbit/s PAM4 Error Detector (ED) MU196040B option for the Signal Quality Analyser-R MP1900A series is now available from Anritsu Corporation.


Vinay Prabhakar Minj
Vinay Prabhakar Minj
Vinay Prabhakar Minj is a technology writer and science communication specialist with a Master’s degree in Communication of Science and Innovation (Science Communication). He is a prolific contributor to Electronics For You, where he has authored over 1,000 articles covering electronics, semiconductors, embedded systems, IoT, and emerging technologies. With a strong foundation in science communication, Vinay focuses on translating complex engineering concepts into clear, accessible, and application-oriented content. His work spans topics such as sensor technologies, chip design, wireless systems, and next-generation electronics, making advanced innovations easier to understand for engineers, students, and industry professionals. Through his extensive contributions, he has built a reputation for delivering reliable, well-researched, and practical insights that help readers stay updated with the rapidly evolving electronics ecosystem. His writing bridges the gap between technical depth and real-world usability, supporting both learning and decision-making in the field.

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