The system enables precise current and voltage measurement in high-power semiconductor testing. It aims to improve production efficiency and reliability in applications such as electric mobility, datacentres, and industrial automation.
Teradyne launches its latest Electronics Test Systems called ETS-800 D20, a test system for power semiconductors. The launch comes as semiconductor manufacturers face tighter accuracy and speed requirements driven by rising AI workloads and expanding electric mobility infrastructure.
It is used to measure the performance, current flow, and voltage stability of power devices such as transistors, MOSFETs, IGBTs, and analogue ICs.
These components regulate power delivery in computing systems and electric vehicles, where even small variations can affect energy efficiency and heat generation. The ETS-800 ensures each device meets reliability and performance standards before entering large-scale production.
This new configuration is a dual sector test head system that provides a flexible and efficient platform for all test insertions and package types. The system can be configured at low density for low volume testing with up to two instruments, or at high density for high volume testing with up to eight sites that can be tested in parallel.
All ETS-800 systems share a common hardware and software environment, allowing engineers to reuse test programs and instruments across models. This reduces time spent on setup and transition between product types. The platform’s wide dynamic range enables the testing of both precision analogue and high-power devices within a single system.
With the ETS-800 D20, Teradyne focuses on improving throughput and scalability in semiconductor testing as power and AI applications converge. The system supports manufacturers working to meet higher power efficiency and reliability standards in modern computing, transport, and industrial systems.
