Friday, April 19, 2024

Test Solution For Satellite Network Devices

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The test solution for satellite network devices enhances connectivity and performance validation for Non-Terrestrial Networks in the Geostationary Earth Orbit, ensuring reliable communication.


Anritsu Corporation has introduced a protocol test solution for Non-Terrestrial Network (NTN) devices for Geostationary Earth Orbit (GEO) satellites. This solution extends the functionality of the Signalling Tester MD8430A to support NTN NarrowBand Internet of Things (NB-IoT) defined in 3GPP Release 17.

The primary users of this product are expected to be NTN device vendors, satellite communication service providers, research and development teams, and telecommunication companies. These users will leverage the solution to test and validate their devices’ performance, connectivity, and compliance with the 3GPP Release 17 standards. The solution is particularly crucial for testing the connectivity and performance of NTN devices for GEO satellites, as it can simulate the communication delay and transmit information to the device for delay compensation. This is essential for ensuring reliable communication over the approximately 36,000 km distance between the satellite and the device.

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The MD8430A is a base station simulator designed to create a simulated network essential for developing chipsets and devices. It offers a software option, NTN NB-IoT (GEO) MD8430A-043, and a control software option, NTN over IoT Framework for RTD MX800050A-070. These options enable the MD8430A to connect to an NTN device for Geostationary Earth Orbit (GEO) satellites, facilitating the testing of connections with the NTN network and the ability to roam between the terrestrial network and the NTN network, among other functions.

Some of the key specifications include:

  • LTE-Advanced Pro testing: 6CCs CA
  • Dual Connectivity test support
  • Licensed-Assisted Access (LAA) test support
  • LTE-Advanced FDD/TDD Release 12 support
  • DL 6CCs, UL 3CCs for CA
  • CA handover, 4×4 MIMO, 8×4 MIMO support
  • Full-digital fading test support
  • DL 2 Gbps, UL 300 Mbps throughput test
  • Inter-RAT tests with MD8480C, MD8475A
  • Optimised investment for R&D to conformance testing
  • Full toolset for L1, L2, L3 scenario development
  • Supports LTE Cat-M/NB-IoT

The device models cater to different development stages and offer retrofit upgrades, allowing developers to tailor their investments and ensure flexible future upgrades.

Nidhi Agarwal
Nidhi Agarwal
Nidhi Agarwal is a journalist at EFY. She is an Electronics and Communication Engineer with over five years of academic experience. Her expertise lies in working with development boards and IoT cloud. She enjoys writing as it enables her to share her knowledge and insights related to electronics, with like-minded techies.


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