Can a benchtop microscope deliver higher-resolution analysis with less manual work? An SEM combines 20kV imaging with automated particle measurement.
JEOL has launched the JCM-7000Plus NeoScope, a benchtop scanning electron microscope (SEM) designed for higher-resolution observation and more efficient analysis in electronics, automotive, metals, chemicals, and manufacturing applications.
The microscope is aimed at users who rely on SEMs for research, quality control, inspection, and routine measurement. By combining higher-resolution imaging with automated analysis, it can reduce manual work involved in examining samples, measuring particles, and preparing reports.
The system increases its landing voltage to 20kV, improving resolution to 6nm for secondary electron imaging and 8nm for backscattered electron imaging. An improved backscattered electron detector also enhances image quality, supporting observation at higher magnification.
For routine analysis, the microscope adds automated functions that can collect measurements and generate results during observation. Live Particle automatically measures particle size and count in real time, while Live Report collects data and generates reports as the field of view is moved.
The system retains the existing GUI, including Zeromag for transitioning from optical imaging to SEM observation and Live Analysis for real-time elemental analysis. Live Map and Live 3D functions are also retained. A new Neo Action function adds further automation for routine observation and analysis tasks.
The combination of higher accelerating voltage, improved detection, and automated measurement is intended to make high-resolution SEM analysis more practical for routine inspection and analytical workflows.
For the official announcement, click here.
