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HomeElectronics NewsPXI Express Platforms For Semiconductor Testing

PXI Express Platforms For Semiconductor Testing

As semiconductor testing grows more complex, PXI Express platforms can bring changes at both the measurement channel and system architecture levels.

ADLINK Introduces New PXI Express Platforms for High-Precision and Cost-effective Test & Measurement Systems
ADLINK Introduces New PXI Express Platforms for High-Precision and Cost-effective Test & Measurement Systems

ADLINK Technology has introduced two new PXI Express platforms, the PXIe 9908 Source Measurement Unit and the PXES 2596 chassis, aimed at semiconductor and electronic test and measurement applications. The additions expand its PXI portfolio with options intended to support precision electrical characterization and scalable system architectures from validation through to higher volume production.

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At the system level, the chassis offers a 9 or 12 slot PXI Express platform built on a Gen3 backplane, delivering up to 16 GB per second bandwidth for multi module and synchronized test configurations. A backplane only variant is also available, incorporating pre-installed heat sinks, on board thermal sensors and fan curve support to facilitate integration into custom mechanical designs. The configuration flexibility is positioned for ODMs and system integrators requiring tailored deployment.

At the measurement level, the measuring system is an eight channel, four quadrant SMU designed for voltage and current sourcing and measurement in device characterization, IC testing and reliability validation. It supports update rates of up to 100 kS per second and sampling rates of up to 1 MS per second. The specification enables wide range measurements while maintaining sensitivity to low level signals, commonly required in advanced semiconductor and low power electronics testing.

Together, the platforms combine high speed measurement capability with scalable chassis architecture, addressing requirements for modular, synchronized and production ready test environments across semiconductor, electronics and optoelectronic applications.

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“Modern automated test systems require both precision at the measurement level and scalability at the system level,” said Andy Tseng, Senior Manager, Product Division at ADLINK Technology. “With the PXIe 9908 and PXES 2596, we are enabling customers to build flexible PXI platforms that scale efficiently from validation to high volume production.”

Saba Aafreen
Saba Aafreen
Saba Aafreen is a Tech Journalist at EFY who blends on-ground industrial experience with a growing focus on AI-driven technologies in the evolving electronic industries.

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