Wednesday, April 24, 2024

Revolutionizing Electronics Inspection With New AOI System

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  • Dive into the future of electronics inspection with the new high-volume AOI, designed on a robust mechanical foundation for unmatched stability and precision. 
  • Experience a revolution in smart manufacturing, as this device delivers real-time insights for data-driven decisions.

Test Research, Inc. (TRI), an electronics manufacturing industry, has unveiled its latest offering – the AOI TR7700 SIII Ultra. This advanced high-volume Automated Optical Inspection (AOI) is structured on a robust mechanical foundation, ensuring stability, accuracy, and precision throughout the inspection process. Catering to the evolving demands of the modern industrial landscape, it seamlessly integrates with Industry 4.0 protocols, aligning with contemporary smart factory benchmarks and rigorously adhering to The Hermes Standard (IPC-HERMES-9852).

It has good inspection speeds, clocking in at a swift 60 cm²/sec. This High-Speed AOI system seamlessly blends advanced AI algorithms with the company’s smart programming and metrology measurements, ensuring inspection depth and pinpoint accuracy. The latest AOI launch responds to the industry’s demand for top-tier efficiency while maintaining accuracy. Its cutting-edge mechanical foundation ensures stability, pinpoint accuracy, and impeccable precision with each inspection run. Available in a Dual Lane setup, this AOI magnifies its prowess, optimizing productivity even in the most rapid inspection environments.

The key specifications include:

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Imaging Method: Dynamic Imaging

Top Camera:4 MP High-Speed Color Camera

Imaging Resolution:10 µm

Lighting:Multi-phase RGB+W LED

PCB Thickness:0.6-5 mm

Dimensions:1100 x 1720 x 1710 mm

Weight:940 kg

The equipment’s intelligent programming ensures rapid readiness, making it operational for inspections in minutes and doing away with extended setup durations. But it’s not just about speed; meticulous attention has been given to the accuracy of outcomes. An upgraded mechanical framework bolsters this precision, ensuring utmost stability and diminishing the likelihood of errors arising from shifts or misalignments. Acknowledging the value of perpetual enhancement, the system is equipped with a closed-loop structure, integrating feedback and feedforward mechanisms. This guarantees a responsive and forward-thinking inspection process, aptly adjusting to immediate alterations while foreseeing upcoming needs.

Effortlessly merging with smart factories, AOI enhances decision-making based on data and amplifies efficiency by providing real-time SPC insights.

Akanksha Gaur
Akanksha Gaur
Akanksha Sondhi Gaur is a journalist at EFY. She has a German patent and brings a robust blend of 7 years of industrial & academic prowess to the table. Passionate about electronics, she has penned numerous research papers showcasing her expertise and keen insight.

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