Thursday, July 10, 2025

Test Platform For High Speed Electronics Testing

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With 2 GHz bandwidth, ultra-low noise, and parallel testing capabilities, a new test system is set to revolutionize quantum, aerospace, and semiconductor applications.

Test Platform For High Speed Electronics Testing

Liquid Instruments has unveiled its latest innovation in electronic test systems with the launch of the Moku:Delta — the most advanced member of its Moku platform family to date. Designed for engineers and scientists working in cutting-edge fields such as quantum computing, aerospace, defense, and semiconductor testing, Moku:Delta brings unmatched flexibility and performance to the lab bench.

The key specifications include:

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  • 2 GHz analog bandwidth for high-frequency signal analysis
  • 5 GSa/s sampling on 8 analog input channels
  • 10 GSa/s on 8 analog output channels for fast waveform generation
  • Ultra-low noise floor: < 10 nV/√Hz at 100 Hz
  • High clock stability: 1 ppb with OCXO reference
  • Ideal for capturing weak signals with high precision

It is a reconfigurable instrumentation platform that supports up to eight instruments running simultaneously, all within a single 2U device. Powered by a third-generation Xilinx RFSoC FPGA, the platform enables ultra-fast signal acquisition, real-time processing, waveform generation, and digital control — making it ideal for high-performance and complex test environments.

Test Platform For High Speed Electronics Testing

It supports 32 digital I/O channels, allowing users to capture and drive logic-level signals for synchronized and integrated testing. With the ability to reconfigure the FPGA in real time, users can switch between or run multiple instruments—up to eight at once—from a suite of 15 tools including oscilloscopes, spectrum analyzers, waveform generators, and more.

Ideal for reducing setup times and enabling rapid experimentation, this platform allows over 2 billion test configurations, catering to complex setups without the need for multiple instruments. Whether it’s analyzing qubit behavior in a quantum lab or validating high-speed components in aerospace systems, it provides a powerful, compact, and future-ready solution for next-gen engineering challenges.

Akanksha Gaur
Akanksha Gaur
Akanksha Sondhi Gaur is a journalist at EFY. She has a German patent and brings a robust blend of 7 years of industrial & academic prowess to the table. Passionate about electronics, she has penned numerous research papers showcasing her expertise and keen insight.

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