Struggling to test complex chips fast and at low cost? See how a compact air-cooled system increases speed, lowers cost, and improves testing.
Many semiconductor manufacturers face challenges testing complex devices efficiently while keeping costs and space requirements low. Smaller production runs and high-mix device portfolios make traditional test systems expensive and slow. Existing air-cooled testers may lack the performance needed for modern applications, while legacy systems like the T6500 and T7700 are reaching end-of-life, leaving companies needing replacements that can handle diverse device types without adding power or cooling overhead.
Advantest’s T2000 AiR2X addresses these challenges by providing a compact, air-cooled test system designed for evaluation and high-mix, low-volume production. It doubles the test resources of the previous T2000 AiR system while maintaining low power consumption and cooling requirements, making it suitable for facilities with space or energy constraints.
The system supports flexible measurement setups, including up to 12 modules for functional/SCAN testing, high-precision DC, and automotive device DC testing up to 320 V. Its multisite controller reduces test time during volume production, helping engineers increase throughput.
Built on the T2000 RECT550 performance board, the AiR2X allows a wide range of configurations with a unified infrastructure and expandable modules, all compatible with existing T2000 programs. The Rapid Development Kit simplifies program creation and debugging, enabling faster migration from older systems.
Initial evaluations show the AiR2X can handle industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile applications, and power analog devices. With global demand for compact air-cooled testers, the system is expected to strengthen testing capabilities across diverse semiconductor markets when it becomes generally available later this month.
“Our compact, air-cooled T2000 AiR2X and high-density, high-pin-count V93000 create a unified test solution that covers the full spectrum of SoCs—from air-cooled segments to large-scale, digitally rich devices,” said Toshiaki Adachi, leader, T2000 Product Unit, Advantest. “The T2000 boosts deployment efficiency, eases migration from aging testers, and doubles resource capacity per floor area, while the V93000 delivers the performance required for advanced, large-scale SoCs. Together, this complementary pair reduces SoC deployment costs and environmental impact, from evaluation through to mass production, providing comprehensive solutions to empower customer innovation.”
