Friday, October 4, 2024

Microcontrollers For Optical Monitoring

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The microcontroller technology enhances optical module performance with monitoring capabilities, interfaces, and programming options.

Microcontrollers

Holtek has released a 32-bit Arm Cortex-M0+ Optical Module DDM MCUs, the HT32F52234 and HT32F52244. These devices are designed for optical modules and feature a 12-channel SAR A/D converter capable of speeds up to 1Msps with a configurable reference voltage, VREF. This configuration enables the monitoring of optical module parameters like RX/TX power, voltage, temperature, and bias current, facilitating digital diagnostic monitoring (DDM).

The MCUs have three I²C interfaces that operate in master and slave modes with frequencies up to 1MHz and support a non-clock stretching function with transfer rates up to 400kbps. They include four D/A converters for optical module-related functions and are available in a compact 24-pin QFN (3×3mm) package.

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These devices operate between 1.65V to 3.6V and have an industrial temperature range of -40°C to 105°C. They offer a high operation speed of up to 60MHz, 64K bytes of Flash Program Memory, 8KB of SRAM Data Memory, and a 6-channel PDMA. They also feature GPIOs that support up to 5V and a range of peripherals, including PWM, SCTMs, BFTMs, RTC, WDT, and multiple communication interfaces. These MCUs have a hardware divider, a CRC16/32 data checking mechanism, a 12-channel SAR A/D converter, and four 12-bit D/A converters with a 500 kbps conversion rate. They are available in 24/32/46-pin QFN and 48-pin LQFP packages, supporting up to 40 GPIO pins.

The series is compatible with several development environments, including Keil, IAR, SEGGER, and GNU, and comes with support resources such as hardware development kits, peripheral driver firmware libraries, and application examples. The series is licensed with Keil MDK-ARM and offers ISP (In-System Programming) and IAP (In-Application Programming) options for firmware updates. It meets UL/IEC 60730-1 Class B certification standards and includes a Safety Test Library to reduce product certification times.

Nidhi Agarwal
Nidhi Agarwal
Nidhi Agarwal is a journalist at EFY. She is an Electronics and Communication Engineer with over five years of academic experience. Her expertise lies in working with development boards and IoT cloud. She enjoys writing as it enables her to share her knowledge and insights related to electronics, with like-minded techies.

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