HomeElectronics NewsA Tool Built For The Next Wave Of Data Speeds

A Tool Built For The Next Wave Of Data Speeds

A testing system that can check errors in network links. Can this help companies test optical and copper connections before products move to production and deployment?

Keysight Expands Digital Layer Error Performance Validation for High Speed 1.6T Interconnects in AI Data Centers
Keysight Expands Digital Layer Error Performance Validation for High Speed 1.6T Interconnects in AI Data Centers

Keysight Technologies has introduced the Functional Interconnect Test Solutions (FITS) portfolio along with its first product, FITS-8CH. The system validates digital-layer bit error ratio (BER) and forward error correction (FEC) performance in high-speed optical and copper interconnects used in network equipment and production networks.

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As interconnect speeds rise and designs become more complex, chip makers, interconnect suppliers, and network equipment manufacturers need stronger validation before mass production and during manufacturing. Physical-layer test tools check electrical lanes against industry specifications and set a compliance baseline. System-level validation extends this by examining the performance of fully integrated interconnects and sub-assemblies, including how errors behave under real operating conditions.

Reliable assessment of real-world performance requires high-speed error testing across all electrical or optical lanes. Without this validation, manufacturers face a higher risk of production delays and field failures. This is especially important for high-speed PAM4 electrical lanes running at 53 Gb/s, 106 Gb/s, and 212 Gb/s that support modern 400GE, 800GE, and 1.6T Ethernet network architectures.

FITS-8CH addresses this gap by enabling multi-lane error performance validation at the digital layer. It supports PAM4 error testing across key electrical lane speeds and complements physical-layer measurements. The system helps engineers validate high-speed interconnects during design, development, and manufacturing. It can also integrate with other physical-layer test solutions from Keysight Technologies to support a wider range of applications and network topologies.

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Ram Periakaruppan, Vice President and General Manager, Network Test & Security Solutions, Keysight, said: “As validation requirements move up the stack from the physical layer, our customers increasingly need solutions that scale across development, manufacturing, and deployment. FITS8CH represents Keysight’s expansion into digital layer interconnect validation, combining years of deep measurement expertise with the global reach, field support, and portfolio continuity customers rely on for production environments including AI data centers.

Nidhi Agarwal
Nidhi Agarwal
Nidhi Agarwal is a Senior Technology Journalist at Electronics For You, specialising in embedded systems, development boards, and IoT cloud solutions. With a Master’s degree in Signal Processing, she combines strong technical knowledge with hands-on industry experience to deliver clear, insightful, and application-focused content. Nidhi began her career in engineering roles, working as a Product Engineer at Makerdemy, where she gained practical exposure to IoT systems, development platforms, and real-world implementation challenges. She has also worked as an IoT intern and robotics developer, building a solid foundation in hardware-software integration and emerging technologies. Before transitioning fully into technology journalism, she spent several years in academia as an Assistant Professor and Lecturer, teaching electronics and related subjects. This background reflects in her writing, which is structured, easy to understand, and highly educational for both students and professionals. At Electronics For You, Nidhi covers a wide range of topics including embedded development, cloud-connected devices, and next-generation electronics platforms. Her work focuses on simplifying complex technologies while maintaining technical accuracy, helping engineers, developers, and learners stay updated in a rapidly evolving ecosystem.

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