New modular hardware for PXI-based test systems delivers enhanced signal analysis, scalable architectures, and precision data acquisition capabilities for RF, aerospace, semiconductor, and industrial applications.
Emerson has expanded its RF and automated test portfolio with a new range of NI PXI hardware designed to make high-performance test and measurement systems more accessible to a wider base of engineers and developers. The latest additions include the NI PXIe-5108 Oscilloscope, NI PXIe-1081 Hybrid Chassis, NI PXIe-8842/8862 Embedded Controllers, and NI PXIe-6381/6383 Multifunction I/O Modules, all aimed at delivering advanced measurement capabilities at a lower cost point.
Built around the NI PXI platform, the new hardware enables scalable and software-driven automated test systems for applications spanning RF validation, electronics design, aerospace, defence, semiconductor testing, industrial automation, and research laboratories. The portfolio integrates with software tools such as LabVIEW, InstrumentStudio, and TestStand to streamline test development, automation, and deployment workflows.
Key features include:
- Supports synchronised multi-instrument operation within a single PXI platform.
- Compatible with Windows 11 and real-time operating environments.
- Enables software-defined test workflows through integration with automation software suites.
- Designed for scalable system expansion using modular PXI architecture.
- Supports high-channel-count measurements for complex validation and characterisation tasks.
The new portfolio combines high-speed signal acquisition, modular system expansion, embedded processing, and precision data acquisition capabilities to address a broad range of automated test requirements. The oscilloscope option is available in four- and eight-channel configurations and delivers 100 MHz bandwidth, 250 MS/s sampling rates, and 14-bit resolution for accurate multi-channel signal analysis.
The chassis platform features an 18-slot all-hybrid architecture with system bandwidth of up to 2 GB/s, enabling larger and more flexible PXI test configurations. Embedded controller options support both Windows 11 and NI Linux Real-Time environments, providing deterministic performance for demanding automated test applications.
For data acquisition tasks, the multifunction I/O modules offer 18-bit resolution, measurement accuracy down to 980 µV, and support for 16 or 32 channels, enabling precise data capture in automated measurement environments. By combining synchronised measurements, modular scalability, high channel density, and software-defined operation, the new NI PXI hardware provides a cost-effective route to advanced RF and mixed-signal test capabilities while supporting emerging AI-driven analytics and automation workflows.
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