A new boundary-scan and functional-test controller arrives with higher robustness, cleaner signal paths, and configurable TAP mapping for faster, safer board bring-up and production testing.
A new multi-TAP test controller is entering the electronics test landscape, geared toward engineers who need faster JTAG boundary-scan performance and dependable functional testing in both prototyping and production. The device introduces a two-port, four-TAP configuration designed to shrink setup time, boost signal integrity, and survive real-world handling—positioning it as a versatile upgrade for development teams scaling complex boards.
The key features are:
- ±30 V electrical protection across all pins for fault-tolerant testing
- Four configurable JTAG TAPs mapped over 20 GPIO pins
- Up to 166 MHz boundary-scan speed for high-performance test cycles
- Enhanced signal integrity with added ground paths and series termination
- Rugged, industrial-ready build with flexible mounting and licensing options
At the top of its pitch is protection: every pin is guarded to ±30 V, reducing the risk of accidental shorts or miswired connectors damaging tools or boards—an everyday concern during early hardware bring-up. This ruggedisation extends to its mechanical design, with industrial-grade build quality and multiple mounting options for factory floors, service environments, and field diagnostics.
Signal quality is another focal point. Twenty dedicated ground pins and integrated series termination aim to maintain clean waveforms even in noisy lab setups or high-EMI production racks. The controller can reach boundary-scan speeds of up to 166 MHz, making it suitable for modern high-density boards where timing margins are tight and fast access to test data is essential.
Flexibility comes through a fully configurable pin-out. Engineers can assign up to four JTAG TAPs or general-purpose I/O across 20 available pins, streamlining connectivity without custom adapters. This also supports mixed-mode testing, combining JTAG boundary-scan procedures with functional tests driven from GPIO.
The controller integrates seamlessly with established test and programming environments, working with analysis, execution, debug, and flash-programming toolchains already in use across many development and manufacturing setups. It slots into existing workflows without requiring rewrites or requalification, easing adoption for teams with legacy projects. By combining multi-TAP capability, faster scan speeds, robust electrical protection, and flexible licensing, the new controller targets a wide scope—from first-article inspection and board bring-up to volume-production test lines. For engineers balancing time-critical debug with production-grade reliability, it marks a compact but high-impact addition to the test bench.
