Friday, December 12, 2025

USB4 v2.0 Testing Reaches 80G

A newly certified test solution is paving the way for next-gen USB4 v2.0 devices, bringing 80 Gbit/s signal validation, PAM3 signaling checks, and advanced link-training analysis to support the next wave of high-resolution, VR/AR, and high-performance computing hardware.

USB4 v2.0 Testing Reaches 80G

Anritsu has secured USB-IF hardware certification for its USB4 Version 2.0 (USB4 v2) test solution, positioning the company at the center of next-generation high-speed interface validation. The certification covers the MP1900A Signal Quality Analyzer-R, now approved to test the industry’s fastest USB specification, which doubles peak throughput from 40 Gbit/s to 80 Gbit/s.

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The key features are:

  • Supports full USB4 v2.0 validation at 80 Gbit/s data rates
  • Verifies PAM3 signaling and advanced bandwidth-efficiency features
  • Performs precise jitter, noise-stress, and error-rate testing
  • Analyzes updated link-training behavior, including new clock-switch sequences
  • Provides multi-interface support for next-gen high-speed I/O development

At a time when data-hungry workloads, high-resolution video pipelines, external GPUs, ultra-fast SSDs, and VR/AR systems demand uncompromising stability, USB4 v2 represents the most significant leap in USB evolution. The new standard introduces PAM3 signaling to increase bandwidth efficiency, a Frequency Variation Profile that stabilizes link training, and an updated TS2.CLKSW sequence for smoother clock transitions. These improvements raise both performance and reliability requirements for silicon vendors and system manufacturers.

With the certification, the MP1900A became one of the first commercially validated instruments capable of evaluating USB4 v2 receivers against the full compliance suite. That includes error-rate testing, jitter stress, noise injection, and link-training behavior critical for ensuring that new controllers, hosts, cables, and hubs perform predictably at 80 Gbit/s in real-world conditions.

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Demand for rigorous USB4 v2 testing is already building among semiconductor makers designing next-generation control ICs. The next wave is expected from test houses preparing compliance labs, followed by PC, peripheral, and consumer-device OEMs planning USB4 v2 integration into products such as docking stations and high-speed storage hardware.

Under the hood, the MP1900A brings a broad toolset consolidated into one platform. It combines a precision Pulse Pattern Generator for clean, high-quality waveforms with a high-sensitivity error detector, advanced jitter sources (including SJ, RJ, SSC, and BUJ), and both common-mode and differential-mode noise injection. The platform also supports link-training state-machine analysis across multiple interfaces such as PCIe, Thunderbolt, DisplayPort, and up to 800 GbE, making it a versatile workhorse for high-speed I/O development.

By achieving USB-IF certification ahead of wide market rollout, Anritsu positions its MP1900A as a flagship measurement system for the transition to 80 Gbit/s consumer and enterprise interfacesan upgrade cycle that is set to reshape device architecture across computing, display, and immersive-tech ecosystems.

Akanksha Gaur
Akanksha Gaur
Akanksha Sondhi Gaur is a journalist at EFY. She has a German patent and brings a robust blend of 7 years of industrial & academic prowess to the table. Passionate about electronics, she has penned numerous research papers showcasing her expertise and keen insight.

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