A new generation of modular test systems is pushing the boundaries of semiconductor and photonics validation, combining picoamp sensitivity, hot-swappable modules, and built-in automation to streamline workflows from lab to high-volume production.
Tektronix has unveiled the MP5000 Series Modular Precision Test System, a next-generation test platform built for flexibility, precision and high throughput in semiconductor, photonics, and device validation workflows. It packs up to six independent channels in a 1U mainframe, supports hot-swappable SMU (source-measure unit) and PSU modules, and includes embedded automation and synchronization features to streamline complex test applications.
It is designed to minimize downtime while allowing lab-to-production scaling. Users can mix SMU and PSU modules in one mainframe, link or stack mainframes, and swap out modules without shutting down the entire system. Each slot’s power can be controlled independently to maintain uptime even during maintenance or module replacement. Calibration can be done at the module level. The front panel features a touchscreen, and a web interface is also provided for remote monitoring and diagnostics.
The key features include:
- SMU modules measure currents as low as 100 fA and voltages with sub-microvolt resolution.
- Each SMU module supports up to 60 V / 30 W capacity.
- PSU modules provide up to 50 W per channel with 5 A, 50 V output.
Built-in Test-Script Processing (TSP) enables running test routines directly on the instrument, reducing PC-control latency.
Synchronization across multiple instruments is enabled via TSP-Link for sub-microsecond coordination. Other automation paths include support for Python (via a “tm_devices” driver in beta), IVI-C, IVI.NET and LabVIEW drivers (expected soon), and a TSP Toolkit extension for Visual Studio Code. A no-code characterization suite is under development.
The system is aimed at a range of precision testing applications. It supports VCSEL modules and optical components through Light-Current-Voltage (LIV) testing, where fast pulsed current sourcing and accurate photodiode response measurements are critical. In semiconductor device functional testing, it can handle sensors, ICs, and photodiodes across both R&D and production environments. It is also well-suited for characterizing optical transceivers, enabling synchronized LIV sweeps and capturing low-current behavior with high fidelity.
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