HomePress ReleasesEM Clamp For Testing Of Equipment Conforming To IEC-61000-4

EM Clamp For Testing Of Equipment Conforming To IEC-61000-4

Designed for use as a clamp injection device for conducted immunity tests in the frequency range of 150 kHz to 230 MHz

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Com-Power Corporation, a manufacturer of EMC test equipment located in California, USA has recently introduced an Electromagnetic Clamp (also known as EM Clamp) to complement their existing IEC- 61000-4-6 conducted immunity test equipment. The CLEM-6146 EM Clamp is designed for use as a clamp injection device for conducted immunity tests in the frequency range of 150 kHz to 230 MHz. The clamp can also be used for tests over an extended frequency range of 10 kHz to 1 GHz.

The cable connection between the Equipment Under Test (EUT) port to be tested and its Auxiliary Equipment (AE) is placed into the EM Clamp. The EM Clamp provides a means by which RF energy is coupled onto the cable and decoupled from the AE path so that the energy is directed toward the EUT.

The CLEM-6146 incorporates split-core ferrites, which allow the top half of the hinged enclosure to open so that the cable under test can easily be laid into position. Once closed, rotating the two knobs on the front of the clamp (one-quarter turn) engages the locking mechanism that compresses the top and bottom halves of the ferrites together around the cable.

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Specifications


Vinay Prabhakar Minj
Vinay Prabhakar Minj
Vinay Prabhakar Minj is a technology writer and science communication specialist with a Master’s degree in Communication of Science and Innovation (Science Communication). He is a prolific contributor to Electronics For You, where he has authored over 1,000 articles covering electronics, semiconductors, embedded systems, IoT, and emerging technologies. With a strong foundation in science communication, Vinay focuses on translating complex engineering concepts into clear, accessible, and application-oriented content. His work spans topics such as sensor technologies, chip design, wireless systems, and next-generation electronics, making advanced innovations easier to understand for engineers, students, and industry professionals. Through his extensive contributions, he has built a reputation for delivering reliable, well-researched, and practical insights that help readers stay updated with the rapidly evolving electronics ecosystem. His writing bridges the gap between technical depth and real-world usability, supporting both learning and decision-making in the field.

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