Author’s prototype was used to test the following ICs successfully: 4000, 4001, 4002, 4011, 4012, 4023, 4025, 4029, 4030, 4049, 4050, 4068, 4069, 4070, 4071, 4072, 4073, 4075, 4077, 4081, 4082, 4093, 5408, 5409, 5411, 5421, 5479, 7266, 7400, 7401, 7402, 7403, 7404, 7405, 7408, 7409, 7410, 7411, 7412, 7414, 7420, 7421, 7427, 7430, 7432, 7473, 7474, 7476, 7478, 7479, 7486, 74132 and 74393.
ICs 4011, 4023, 4029, 4030, 4069, 4093, 7402, 7404, 7414, 7476 and 74393 were tested in EFY lab.
The number of supported ICs can be enhanced with the incorporation of new functions and libraries to the program. As ATmega2560 MCU has 256kB of flash memory, a program for very large number of ICs can be uploaded.
Unlike a typical IC tester, this device provides many useful features to its user. Nokia 5110 display panel and a 15-key keypad were used in this device for designing a suitable user interface, which enables the truth table exhibition possible.
Users can find help on the testing procedure. While entering the inputs (for example, IC number and time interval), they can clear the digits if entered incorrectly and re-enter the correct ones. Truth tables for each individual gate can be paused for better observation and can be skipped for saving time. There is feasibility of reproducing the previous stage (for re-entering the data) without resetting the device.
16MHz of processing speed makes the time response of this IC tester pretty good. No time-lag is observed while accepting data from the keypad and displaying information over the LCD panel. In case of auto-search, this prototype takes about 0.5 seconds on an average to detect the IC. All these features make this device powerful and user-friendly. A comparison of its features and specifications with two other branded IC testers (DICT-02 (Brand: Kitek) and Leaper-1A (Brand: Leap)) is shown in Table I.
A brief note on the coding is shown in Table II with different uses of variables and in Table III with uses of important functions.