Thursday, December 4, 2025

Resolver Simulation Modules For Precision Testing

A new class of PXI/PXIe simulation modules delivers real-world analog signals at up to 130,000 RPM, enabling ultra-precise testing of high-speed servo systems in mission-critical applications.

Simulation Modules For Precision Testing

Pickering Interfaces has expanded its 41-670 (PXI) and 43-670 (PXIe) resolver simulator family to support high-speed simulation of up to 130,000 RPM. Designed to meet the rising demands of aerospace, automotive, and defense sectors, these modules offer best-in-class performance for testing embedded control systems reliant on high-speed resolvers and variable differential transformers (LVDT, RVDT).

- Advertisement -

The key features are:

  • Available in 2- or 4-bank configurations (model dependent)
  • Each bank simulates 5-, 6-, or dual 4-wire resolver/VDT signals
  • Supports up to 4 or 8 simulation channels per module
  • Ideal for compact, high-density testing of multi-axis systems

Modern embedded control systems require accurate high-speed resolver testing to detect subtle software bugs and validate dynamic behavior. Pickering’s new modules simulate multiple resolver pole pairs with up to 80kHz excitation frequencies—ensuring greater signal fidelity, lower noise, and superior responsiveness. Unlike FPGA-based emulation, these modules employ onboard transformers to produce true analog output, delivering real-world accuracy and high-resolution angle simulation even at top rotational speeds.

The integrated relays allow short/open circuit simulation per channel, minimizing external hardware needs for fault injection. Additionally, programmable phase delays help engineers simulate sensor imperfections, aiding robust software validation. The new high-speed PXI resolver simulators bring unmatched realism and scalability to embedded servo system testing—delivering compact form factor, high signal fidelity, and configurable fault insertion in a single module. Backed by a three-year warranty and long-term support, it’s a future-ready solution for mission-critical hardware-in-the-loop (HIL) testing.

Akanksha Gaur
Akanksha Gaur
Akanksha Sondhi Gaur is a journalist at EFY. She has a German patent and brings a robust blend of 7 years of industrial & academic prowess to the table. Passionate about electronics, she has penned numerous research papers showcasing her expertise and keen insight.

SHARE YOUR THOUGHTS & COMMENTS

EFY Prime

Unique DIY Projects

Electronics News

Truly Innovative Electronics

Latest DIY Videos

Electronics Components

Electronics Jobs

Calculators For Electronics

×