The test tools for power electronics help make devices faster, smaller, and more reliable with easier and smarter testing methods.
At PCIM Expo Rohde & Schwarz will present its latest innovations in testing and analysis for power electronic systems and components. Design engineers working in sectors such as e-mobility, renewable energy, and AI data centers will benefit from the company’s comprehensive T&M solutions, which support the development of highly efficient, reliable power electronics. These tools are engineered for high-speed switching, improved power density, and operation at elevated temperatures—key requirements for next-gen WBG devices.
At the heart of the demonstrations is the R&S RT-ZISO isolated probing system, delivering exceptional accuracy, sensitivity, dynamic range, and bandwidth. Rohde & Schwarz will compare the RT-ZISO’s performance with conventional single-ended probes in a setup analyzing the switching behavior of GaN-based MOSFETs.
In partnership with PE-Systems GmbH, Rohde & Schwarz will showcase a precise, stable double pulse test setup using the MXO 5 eight-channel oscilloscope and the RT-ZISO probe. This live demonstration will evaluate 1200 V SiC devices from Wolfspeed, commonly used in automotive traction inverters.
Also in collaboration with PE-Systems GmbH, the companies will demonstrate automated loadjump testing on a Buck converter from Monolithic Power Systems, Inc. The system—featuring the MXO 5 oscilloscope and RT-ZISO—reduces testing time while increasing the number of reference points. It supports full automation of load current, input voltage, and temperature profiles over a 6V to 60V range.
Rohde & Schwarz will display solutions for characterizing passive components with the R&S LCX LCR meters, capable of measuring up to 10 MHz. These meters are ideal for analyzing voltage-dependent capacitance in MLCCs. Paired with sweep software, they enable detailed data visualization across multiple parameters.
Dr. Philipp Weigell, Vice President of the Industry, Components, Research & University Market Segment at Rohde & Schwarz, explains: “PCIM Expo is an important venue for us to highlight our advancements in wide bandgap semiconductor testing. Testing plays a critical role to improve power efficiency, reduce size, and manage heat more effectively in power conversion applications used in AI data centers, for instance. Through collaboration with industry experts and with our advanced testing solutions we enable our customers to develop reliable and efficient systems that meet the rigorous demands of modern data processing applications.”
