HomeElectronics NewsCompact AFM System For Research

Compact AFM System For Research

The atomic force microscope offers advanced features, versatility, and ease of use, enhancing research productivity with high-quality data and customizable modes.

Bruker Introduces Dimension Nexus™ Atomic Force Microscope
Bruker Introduces Dimension Nexus™ Atomic Force Microscope

Bruker Corporation has announced the Dimension Nexus atomic force microscope (AFM). This latest addition to the Dimension AFM product line, with over 4,600 systems installed worldwide, features the advanced NanoScope 6 controller and a compact design. The Dimension Nexus expands access to Bruker’s exclusive PeakForce Tapping technology and supports over 50 AFM modes. Its upgradability and user-friendly design offer a balance of performance and value, catering to the needs of growing labs and multi-user facilities.

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The Dimension Nexus builds on decades of AFM innovation to deliver outstanding value. Its open-architecture design, with low drift and noise, allows researchers to obtain high-quality data for standard and custom experiments. Equipped with the high-speed NanoScope 6 controller and Bruker’s ScanAsyst technology, it offers exceptional ease of use. The compact, versatile system enhances productivity with a programmable stage for high-throughput, multi-site analysis. It also supports advanced modes like AFM-nDMA for viscoelastic measurements, PeakForce QNM for high-resolution mechanical property mapping, and DataCube modes for hyperspectral imaging.

“We already have a number of Bruker AFMs in our open-access user facilities and are always looking for new technology that can further support the many researchers we serve from both academia and industry,” said Dr Alice Pyne, Head of the Henry Royce Nanocharacterisation Laboratory at the University of Sheffield. “I especially appreciate the compact and upgradable nature of the Dimension Nexus large-sample AFM and the fact that it can perform the latest PeakForce Tapping modes. I can see this being a real advantage for multi-user labs, where AFM expertise and applications vary, and where physical space for instruments is at a premium.”

“With the release of Nexus, we have taken a significant step in making the latest AFM technology available to a wider research community,” added Thomas Mueller, Senior Director of AFM Instrumentation at Bruker. “Its combination of data quality, performance, and versatility make it both an excellent starter AFM and a perfect addition to a thriving AFM lab.”

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Nidhi Agarwal
Nidhi Agarwal
Nidhi Agarwal is a Senior Technology Journalist at Electronics For You, specialising in embedded systems, development boards, and IoT cloud solutions. With a Master’s degree in Signal Processing, she combines strong technical knowledge with hands-on industry experience to deliver clear, insightful, and application-focused content. Nidhi began her career in engineering roles, working as a Product Engineer at Makerdemy, where she gained practical exposure to IoT systems, development platforms, and real-world implementation challenges. She has also worked as an IoT intern and robotics developer, building a solid foundation in hardware-software integration and emerging technologies. Before transitioning fully into technology journalism, she spent several years in academia as an Assistant Professor and Lecturer, teaching electronics and related subjects. This background reflects in her writing, which is structured, easy to understand, and highly educational for both students and professionals. At Electronics For You, Nidhi covers a wide range of topics including embedded development, cloud-connected devices, and next-generation electronics platforms. Her work focuses on simplifying complex technologies while maintaining technical accuracy, helping engineers, developers, and learners stay updated in a rapidly evolving ecosystem.

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