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The probe system is suitable for meeting complex test and measurement specifications and achieve a high-efficiency for countering environmental noise experienced in conventional probe systems FormFactor, a semiconductor test and measurement supplier, has introduced the CM300xi-ULN, a 300mm wafer probe...
Allows testing of up to 3000 die simultaneously from previous 1500 die testing Incorporates new custom electronics for enhanced signal integrity to enable highly parallel tests FormFactor, a semiconductor test and measurement supplier, has reached a high-throughput milestone in...